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DFT
1993
IEEE

Layout Level Design for Testability Strategy Applied to a CMOS Cell Library

14 years 3 months ago
Layout Level Design for Testability Strategy Applied to a CMOS Cell Library
M. Rullán, F. C. Blom, J. Oliver, C. Ferrer
Added 08 Aug 2010
Updated 08 Aug 2010
Type Conference
Year 1993
Where DFT
Authors M. Rullán, F. C. Blom, J. Oliver, C. Ferrer
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