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26

VLSID
2006
IEEE

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On the Size and Generation of Minimal N-Detection Tests

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On the Size and Generation of Minimal N-Detection Tests

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The main result of this paper, proved as a theorem, is that a lower bound on the number of test vectors that detect each fault at least N times is N

Kalyana R. Kantipudi

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Added	12 Jun 2010
Updated	12 Jun 2010
Type	Conference
Year	2006
Where	VLSID
Authors	Kalyana R. Kantipudi

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