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» On the Size and Generation of Minimal N-Detection Tests
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DATE
2005
IEEE
99views Hardware» more  DATE 2005»
14 years 1 months ago
Worst-Case and Average-Case Analysis of n-Detection Test Sets
Test sets that detect each target fault n times (n-detection test sets) are typically generated for restricted values of n due to the increase in test set size with n. We perform ...
Irith Pomeranz, Sudhakar M. Reddy
VLSID
2006
IEEE
94views VLSI» more  VLSID 2006»
14 years 1 months ago
On the Size and Generation of Minimal N-Detection Tests
The main result of this paper, proved as a theorem, is that a lower bound on the number of test vectors that detect each fault at least N times is N
Kalyana R. Kantipudi
ECAI
2008
Springer
13 years 9 months ago
Test Generation for Model-Based Diagnosis
This article formalises the dual problem to model-based diagnosis (MBD), i.e., generating tests to isolate multiple simultaneous faults. Using a standard propositional MBD framewo...
Gregory M. Provan
DAC
2004
ACM
13 years 11 months ago
On test generation for transition faults with minimized peak power dissipation
This paper presents a method of generating tests for transition faults using tests for stuck-at faults such that the peak power is the minimum possible using a given set of tests ...
Wei Li, Sudhakar M. Reddy, Irith Pomeranz
KBSE
2005
IEEE
14 years 1 months ago
An analysis of rule coverage as a criterion in generating minimal test suites for grammar-based software
The term grammar-based software describes software whose input can be specified by a context-free grammar. This grammar may occur explicitly in the software, in the form of an in...
Mark Hennessy, James F. Power