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DATE
2005
IEEE

Specification Test Compaction for Analog Circuits and MEMS

14 years 6 months ago
Specification Test Compaction for Analog Circuits and MEMS
Sounil Biswas, Peng Li, R. D. (Shawn) Blanton, Lar
Added 24 Jun 2010
Updated 24 Jun 2010
Type Conference
Year 2005
Where DATE
Authors Sounil Biswas, Peng Li, R. D. (Shawn) Blanton, Larry T. Pileggi
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