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56

DATE
2005
IEEE

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Specification Test Compaction for Analog Circuits and MEMS

15 years 8 months ago

Specification Test Compaction for Analog Circuits and MEMS

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Sounil Biswas, Peng Li, R. D. (Shawn) Blanton, Lar

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More Details (n/a)

Added	24 Jun 2010
Updated	24 Jun 2010
Type	Conference
Year	2005
Where	DATE
Authors	Sounil Biswas, Peng Li, R. D. (Shawn) Blanton, Larry T. Pileggi

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