Static Compaction of Delay Tests Considering Power Supply Noise

Excessive power supply noise can lead to overkill during delay test. A static compaction algorithm is described in this paper that prevents such overkill. A power supply noise estimation tool has been built and integrated into the compaction process. Compaction results for KLPG delay tests for ISCAS89 circuits under different power grid environments are presented.

• Type: Conference
• Year: 2005
• Where: VTS
• Authors: Jing Wang 0006, Xiang Lu, Wangqi Qiu, Ziding Yue, Steve Fancler, Weiping Shi, D. M. H. Walker
• Keywords: Delay Tests, Power Supply Noise, Static Compaction Algorithm, VTS 2005