Statistical timing analysis based on a timing yield model

Starting from a model of the within-die systematic variations using principal components analysis, a model is proposed for estimation of the parametric yield, and is then applied to estimation of the timing yield. Key features of these models are that they are easy to compute, they include a powerful model of withindie correlation, and they are "full-chip" models in the sense that they can be applied with ease to circuits with millions of components. As such, these models provide a way to do statistical timing analysis without the need for detailed statistical analysis of every path in the design. Categories and Subject Descriptors B.7 [Integrated Circuits]: Design Aids General Terms Algorithms, Design, Theory Keywords Statistical timing analysis, timing yield, principal components

• Type: Conference
• Year: 2004
• Where: DAC
• Authors: Farid N. Najm, Noel Menezes
• Keywords: DAC 2004, Design Automation, Keywords Statistical Timing, Statistical Timing Analysis, Timing Yield