DAC
2004
ACM
13 years 11 months ago
2004
ACM
The ability to control the variations in IC fabrication process is rapidly diminishing as feature sizes continue towards the sub-100 nm regime. As a result, there is an increasing...
ISCAS
2005
IEEE
14 years 28 days ago
2005
IEEE
—As process variations become a significant problem in deep sub-micron technology, a shift from deterministic static timing analysis to statistical static timing analysis for hig...
PATMOS
2007
Springer
14 years 1 months ago
2007
Springer
Abstract. The continuous miniaturization of semiconductor devices imposes serious threats to design robustness against process variations and environmental fluctuations. Modern ci...
ASPDAC
2009
ACM
14 years 1 months ago
2009
ACM
—Considering process variability at the behavior synthesis level is necessary, because it makes some instances of function units slower and others faster, resulting in unbalanced...
DAC
2004
ACM
14 years 8 months ago
2004
ACM
Starting from a model of the within-die systematic variations using principal components analysis, a model is proposed for estimation of the parametric yield, and is then applied ...