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» A Case Study of IR-Drop in Structured At-Speed Testing
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ICCAD
1997
IEEE
147views Hardware» more  ICCAD 1997»
14 years 3 months ago
Built-in test generation for synchronous sequential circuits
We consider the problem of built-in test generation for synchronous sequential circuits. The proposed scheme leaves the circuit flip-flops unmodified, and thus allows at-speed ...
Irith Pomeranz, Sudhakar M. Reddy
CORR
2008
Springer
88views Education» more  CORR 2008»
13 years 11 months ago
Online Sensor Testing through Superposition of Encoded Stimulus
Online monitoring remains an important requirement for a range of microsystems. The solution based on the injection of an actuating test stimulus into the bias structure of active...
Norbert Dumas, Zhou Xu, Kostas Georgopoulos, R. Jo...
IWPC
2010
IEEE
13 years 9 months ago
Studying the Impact of Social Structures on Software Quality
Abstract—Correcting software defects accounts for a significant amount of resources such as time, money and personnel. To be able to focus testing efforts where needed the most,...
Nicolas Bettenburg, Ahmed E. Hassan
SIGSOFT
2010
ACM
13 years 8 months ago
Representation dependence testing using program inversion
The definition of a data structure may permit many different concrete representations of the same logical content. A (client) program that accepts such a data structure as input i...
Aditya Kanade, Rajeev Alur, Sriram K. Rajamani, Ga...
BMCBI
2007
123views more  BMCBI 2007»
13 years 11 months ago
PedGenie: meta genetic association testing in mixed family and case-control designs
Background-: PedGenie software, introduced in 2006, includes genetic association testing of cases and controls that may be independent or related (nuclear families or extended ped...
Karen Curtin, Jathine Wong, Kristina Allen-Brady, ...