An important aspect of Design for Yield for embedded SRAM is identifying the expected worst case behavior in order to guarantee that sufficient design margin is present. Previousl...
Abstract. A lot of research has been done to promote and develop good elearning models, practices, and technological environments. However, fewer efforts were deployed to support e...
Algorithms that use point-cloud models make heavy use of the neighborhoods of the points. These neighborhoods are used to compute the surface normals for each point, mollificatio...
Errors in dynamic random access memory (DRAM) are a common form of hardware failure in modern compute clusters. Failures are costly both in terms of hardware replacement costs and...
Transactional memory (TM) has shown potential to simplify the task of writing concurrent programs. Inspired by classical work on databases, formal definitions of the semantics of...
Rachid Guerraoui, Thomas A. Henzinger, Michal Kapa...