—Page’s test is optimal for detecting a permanent change in distribution, in the sense that it minimizes the worst case average delay to detection given an average distance bet...
Chunming Han, Peter K. Willett 0002, Biao Chen, Do...
Transient Signal Analysis is a digital device testing method that is based on the analysis of voltage transients at multiple test points. The power supply transient signals of an ...
Amy Germida, Zheng Yan, James F. Plusquellic, Fide...
In this paper, we propose a novel fault-oriented test generation methodology for detection and isolation of faults in analog circuits. Given the description of the circuit-underte...
In this paper, we present an algorithm for time-scale modification of music signals, based on the waveform similarity overlap-and-add technique (WSOLA). A well-known disadvantage o...
Transient Signal Analysis (TSA) is a parametric device testing technique based on the analysis of dynamic (transient) current (iDDT) drawn by the core logic from the power supply ...