68 search results - page 12 / 14 » A Family of Logical Fault Models for Reversible Circuits |
DATE
2003
IEEE
14 years 23 days ago
2003
IEEE
Abstract — This paper defines a new diagnosis problem for diagnosing delay defects based upon statistical timing models. We illustrate the differences between the delay defect d...
AAAI
1996
13 years 8 months ago
1996
Most model-based diagnosis systems, such as GDE and Sherlock, have concerned discrete, static systems such as logic circuits and use simple constraint propagation to detect incons...
ATS
2003
IEEE
14 years 23 days ago
2003
IEEE
Capacitive crosstalk can give rise to slowdown of signals that can propagate to a circuit output and create a functional error. A test generation methodology, called XGEN, was dev...
ISQED
2002
IEEE
14 years 11 days ago
2002
IEEE
Critical systems like pace-makers, defibrillators, wearable computers and other electronic gadgets have to be designed not only for reliability but also for ultra-low power consu...
VLSID
2005
IEEE
14 years 1 months ago
2005
IEEE
During pseudorandom testing, a significant amount of energy and test application time is wasted for generating and for applying “useless” test vectors that do not contribute t...