Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
This paper presents a unifying framework for the modeling of asynchronous pipeline circuits. A pipeline protocol is captured in a graph-based model which defines the partial order...
This paper presents the design and evaluation of an 8-bit adiabatic multiplier. Both the multiplier core and its built-in self-test logic have been designed using a true single-ph...
Suhwan Kim, Conrad H. Ziesler, Marios C. Papaefthy...
In the ECAD area, the Test Generation (TG) problem consists in finding an input vector test for some possible diagnosis (a set of faults) of a digital circuit. Such tests may have ...
This paper presents S2E, a platform for analyzing the properties and behavior of software systems. We demonstrate S2E’s use in developing practical tools for comprehensive perfo...
Vitaly Chipounov, Volodymyr Kuznetsov, George Cand...