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CSREAESA
2008
13 years 11 months ago
BIST-BASED Group Testing for Diagnosis of Embedded FPGA Cores
A group testing-based BIST technique to identify faulty hard cores in FPGA devices is presented. The method provides for isolation of faults in embedded cores as demonstrated by ex...
Alireza Sarvi, Carthik A. Sharma, Ronald F. DeMara
CARDIS
2008
Springer
105views Hardware» more  CARDIS 2008»
13 years 11 months ago
Fast Hash-Based Signatures on Constrained Devices
Digital signatures are one of the most important applications of microprocessor smart cards. The most widely used algorithms for digital signatures, RSA and ECDSA, depend on finite...
Sebastian Rohde, Thomas Eisenbarth, Erik Dahmen, J...
PKC
2000
Springer
118views Cryptology» more  PKC 2000»
14 years 1 months ago
An Identification Scheme Based on Sparse Polynomials
This paper gives a new example of exploiting the idea of using polynomials with restricted coefficients over finite fields and rings to construct reliable cryptosystems and identif...
William D. Banks, Daniel Lieman, Igor Shparlinski
CVPR
2006
IEEE
14 years 1 months ago
Accurate Tracking of Monotonically Advancing Fronts
A wide range of computer vision applications such as distance field computation, shape from shading, and shape representation require an accurate solution of a particular Hamilton...
M. Sabry Hassouna, Aly A. Farag
TSP
2010
13 years 4 months ago
Decentralized sparse signal recovery for compressive sleeping wireless sensor networks
Abstract--This paper develops an optimal decentralized algorithm for sparse signal recovery and demonstrates its application in monitoring localized phenomena using energy-constrai...
Qing Ling, Zhi Tian