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» A Framework Based Measurements for Evaluating an IS Quality
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APSCC
2010
IEEE
13 years 6 months ago
On Evaluating and Publishing Data Concerns for Data as a Service
Abstract--The proliferation of Data as a Service (DaaS) available on the Internet and offered by cloud service providers indicates an increasing trend in providing data under Web s...
Hong Linh Truong, Schahram Dustdar
DATE
2009
IEEE
167views Hardware» more  DATE 2009»
14 years 3 months ago
Analyzing the impact of process variations on parametric measurements: Novel models and applications
Abstract—In this paper we propose a novel statistical framework to model the impact of process variations on semiconductor circuits through the use of process sensitive test stru...
Sherief Reda, Sani R. Nassif
VLSID
2004
IEEE
117views VLSI» more  VLSID 2004»
14 years 9 months ago
Evaluating the Reliability of Defect-Tolerant Architectures for Nanotechnology with Probabilistic Model Checking
As we move from deep submicron technology to nanotechnology for device manufacture, the need for defect-tolerant architectures is gaining importance. This is because, at the nanos...
Gethin Norman, David Parker, Marta Z. Kwiatkowska,...
ESA
2010
Springer
197views Algorithms» more  ESA 2010»
13 years 6 months ago
How to Allocate Goods in an Online Market?
Abstract. We study an online version of Fisher's linear case market. In this market there are m buyers and a set of n dividable goods to be allocated to the buyers. The utilit...
Yossi Azar, Niv Buchbinder, Kamal Jain
ECSQARU
2007
Springer
14 years 13 days ago
Information Affinity: A New Similarity Measure for Possibilistic Uncertain Information
Abstract. This paper addresses the issue of measuring similarity between pieces of uncertain information in the framework of possibility theory. In a first part, natural properties...
Ilyes Jenhani, Nahla Ben Amor, Zied Elouedi, Salem...