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HPDC
2012
IEEE
11 years 9 months ago
Understanding the effects and implications of compute node related failures in hadoop
Hadoop has become a critical component in today’s cloud environment. Ensuring good performance for Hadoop is paramount for the wide-range of applications built on top of it. In ...
Florin Dinu, T. S. Eugene Ng
CASES
2007
ACM
13 years 11 months ago
SCCP/x: a compilation profile to support testing and verification of optimized code
Embedded systems are often used in safety-critical environments. Thus, thorough testing of them is mandatory. A quite active research area is the automatic test-case generation fo...
Raimund Kirner
CLUSTER
2007
IEEE
14 years 1 months ago
Evaluation of fault-tolerant policies using simulation
— Various mechanisms for fault-tolerance (FT) are used today in order to reduce the impact of failures on application execution. In the case of system failure, standard FT mechan...
Anand Tikotekar, Geoffroy Vallée, Thomas Na...
ASPLOS
2006
ACM
14 years 1 months ago
Ultra low-cost defect protection for microprocessor pipelines
The sustained push toward smaller and smaller technology sizes has reached a point where device reliability has moved to the forefront of concerns for next-generation designs. Sil...
Smitha Shyam, Kypros Constantinides, Sujay Phadke,...
DPD
2006
141views more  DPD 2006»
13 years 7 months ago
Efficient parallel processing of range queries through replicated declustering
A common technique used to minimize I/O in data intensive applications is data declustering over parallel servers. This technique involves distributing data among several disks so...
Hakan Ferhatosmanoglu, Ali Saman Tosun, Guadalupe ...