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CVPR
2007
IEEE
14 years 6 months ago
2007
IEEE
We present a novel object-specific segmentation method which can be used in view-based object recognition systems. Previous object segmentation approaches generate inexact results ...
ICCAD
2007
IEEE
14 years 5 months ago
2007
IEEE
—As the 193nm lithography is likely to be used for 45nm and even 32nm processes, much more stringent requirement will be posed on Optical Proximity Correction (OPC) technologies....
ICCAD
2005
IEEE
14 years 5 months ago
2005
IEEE
Many commercially available embedded processors are capable of extending their base instruction set for a specific domain of applications. While steady progress has been made in t...
ICCAD
2004
IEEE
14 years 5 months ago
2004
IEEE
We address the classic wire-length estimation problem and propose a new statistical wire-length estimation approach that captures the probability distribution function of net leng...
SAC
2009
ACM
14 years 3 months ago
2009
ACM
We present a modular approach to implement adaptive decisions with existing scientific codes. Using a sophisticated system software tool based on the function call interception t...