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DAC
2009
ACM
14 years 2 months ago
2009
ACM
Manufacturing process variability impacts the performance of synchronous logic circuits by means of its effect on both clock network and functional block delays. Typically, varia...
ASPDAC
2006
ACM
14 years 1 months ago
2006
ACM
— The rapid increase in IC design complexity and wide-spread use of intellectual-property (IP) blocks have made the so-called mixed-size placement a very important topic in recen...
CASES
2004
ACM
14 years 26 days ago
2004
ACM
Many optimization techniques, including several targeted specifically at embedded systems, depend on the ability to calculate the number of elements that satisfy certain conditio...
SIGMETRICS
2008
ACM
13 years 7 months ago
2008
ACM
Advances in networking technology have enabled network engineers to use sampled data from routers to estimate network flow volumes and track them over time. However, low sampling ...
TCAD
2010
13 years 2 months ago
2010
Starting from the 90nm technology node, process induced stress has played a key role in the design of highperformance devices. The emergence of source/drain silicon germanium (S/D ...