We propose to introduce redundant interconnects for manufacturing yield and reliability improvement. By introducing redundant interconnects, the potential for open faults is reduc...
— With advanced VLSI manufacturing technology in deep submicron (DSM) regime, we can integrate entire electronic systems on a single chip (SoC). Due to the complexity in SoC desi...
This paper presents a methodology for identifying the autonomous system (or systems) responsible when a routing change is observed and propagated by BGP. The origin of such a rout...
Anja Feldmann, Olaf Maennel, Zhuoqing Morley Mao, ...
Advances in fabrication technology have resulted in a continual shrinkage of device dimensions. This has resulted in smaller device delays, greater resistance along interconnect w...