114 search results - page 5 / 23 » A Memory Soft Error Measurement on Production Systems |
DATE
2006
IEEE
14 years 2 months ago
2006
IEEE
As devices are scaled to the nanoscale regime, it is clear that future nanodevices will be plagued by higher soft error rates and reduced noise margins. Traditional implementation...
LCTRTS
2009
Springer
14 years 3 months ago
2009
Springer
Register file (RF) is extremely vulnerable to soft errors, and traditional redundancy based schemes to protect the RF are prohibitive not only because RF is often in the timing c...
EMSOFT
2005
Springer
14 years 2 months ago
2005
Springer
With the scaling of technology, transient errors caused by external particle strikes have become a critical challenge for microprocessor design. As embedded processors are widely ...
DAC
2004
ACM
14 years 9 months ago
2004
ACM
Circuits using nano-meter technologies are becoming increasingly vulnerable to signal interference from multiple noise sources as well as radiation-induced soft errors. One way to...
ACHI
2008
IEEE
13 years 10 months ago
2008
IEEE
The complicated user interfaces and complex functionality of nowadays interactive products lead to a new class of failures: People do not understand their products and thus fail t...