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DAC
2006
ACM
14 years 8 months ago
Process variation aware OPC with variational lithography modeling
Optical proximity correction (OPC) is one of the most widely used resolution enhancement techniques (RET) in nanometer designs to improve subwavelength printability. Conventional ...
Peng Yu, Sean X. Shi, David Z. Pan
CODES
2003
IEEE
14 years 21 days ago
Design space exploration of a hardware-software co-designed GF(2m) galois field processor for forward error correction and crypt
This paper describes a hardware-software co-design approach for flexible programmable Galois Field Processing for applications which require operations over GF(2m ), such as RS an...
Wei Ming Lim, Mohammed Benaissa
CORR
2006
Springer
76views Education» more  CORR 2006»
13 years 7 months ago
Inconsistent parameter estimation in Markov random fields: Benefits in the computation-limited setting
Consider the problem of joint parameter estimation and prediction in a Markov random field: i.e., the model parameters are estimated on the basis of an initial set of data, and th...
Martin J. Wainwright
ISLPED
2006
ACM
145views Hardware» more  ISLPED 2006»
14 years 1 months ago
An optimal analytical solution for processor speed control with thermal constraints
As semiconductor manufacturing technology scales to smaller device sizes, the power consumption of clocked digital ICs begins to increase. Dynamic voltage and frequency scaling (D...
Ravishankar Rao, Sarma B. K. Vrudhula, Chaitali Ch...
TIP
2011
231views more  TIP 2011»
13 years 1 months ago
Variational Bayesian Super Resolution
—In this paper, we address the super resolution (SR) problemfromasetofdegradedlowresolution(LR)imagestoobtain a high resolution (HR) image. Accurate estimation of the sub-pixel m...
S. Derin Babacan, Rafael Molina, Aggelos K. Katsag...