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» A New Approach for Low Power Scan Testing
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DAC
2009
ACM
14 years 2 months ago
O-Router: an optical routing framework for low power on-chip silicon nano-photonic integration
In this work, we present a new optical routing framework, O-Router for future low-power on-chip optical interconnect integration utilizing silicon compatible nano-photonic devices...
Duo Ding, Yilin Zhang, Haiyu Huang, Ray T. Chen, D...
ITC
1999
IEEE
78views Hardware» more  ITC 1999»
13 years 11 months ago
Minimized power consumption for scan-based BIST
Power consumption of digital systems may increase significantly during testing. In this paper, systems equipped with a scan-based built-in self-test like the STUMPS architecture a...
Stefan Gerstendörfer, Hans-Joachim Wunderlich
TVLSI
1998
83views more  TVLSI 1998»
13 years 7 months ago
Low overhead fault-tolerant FPGA systems
— Fault-tolerance is an important system metric for many operating environments, from automotive to space exploration. The conventional technique for improving system reliability...
John Lach, William H. Mangione-Smith, Miodrag Potk...
DAC
1999
ACM
13 years 11 months ago
Stand-by Power Minimization Through Simultaneous Threshold Voltage Selection and Circuit Sizing
We present a new approach for estimation and optimization of the average stand-by power dissipation in large MOS digital circuits. To overcome the complexity of state dependence i...
Supamas Sirichotiyakul, Tim Edwards, Chanhee Oh, J...
RECONFIG
2009
IEEE
182views VLSI» more  RECONFIG 2009»
14 years 2 months ago
Scalability Studies of the BLASTn Scan and Ungapped Extension Functions
BLASTn is a ubiquitous tool used for large scale DNA analysis. Detailed profiling tests reveal that the most computationally intensive sections of the BLASTn algorithm are the sc...
Siddhartha Datta, Ron Sass