945 search results - page 14 / 189 » A New Method for Design of Robust Digital Circuits |
MSE
2005
IEEE
14 years 1 months ago
2005
IEEE
This paper presents the Basic Electronic course syllabus needed to obtain the Telecommunications Engineering degree, adapted to the criteria established by the new European Higher ...
ICTAI
2002
IEEE
14 years 19 days ago
2002
IEEE
In order to reduce the time-to-market and simplify gatelevel test generation for digital integrated circuits, GAbased functional test generation techniques are proposed for behavi...
DAC
2005
ACM
13 years 9 months ago
2005
ACM
Reliability of nanometer circuits is becoming a major concern in today’s VLSI chip design due to interferences from multiple noise sources as well as radiation-induced soft erro...
ICCAD
2003
IEEE
14 years 4 months ago
2003
IEEE
This paper introduces a CAD framework for co-simulation of hybrid circuits containing CMOS and SET (Single Electron Transistor) devices. An improved analytical model for SET is al...
MJ
2007
13 years 7 months ago
2007
With increasingly smaller feature sizes and higher on-chip densities, the power dissipation of VLSI systems has become a primary concern for designers. This paper first describes...