945 search results - page 24 / 189 » A New Method for Design of Robust Digital Circuits |
DAC
2006
ACM
14 years 1 months ago
2006
ACM
Negative bias temperature instability (NBTI) has become the dominant reliability concern for nanoscale PMOS transistors. In this paper, a predictive model is developed for the deg...
DAC
2006
ACM
14 years 8 months ago
2006
ACM
In this paper, we propose a new linear programming based timing driven placement framework for high performance designs. Our LP framework is mainly net-based, but it takes advanta...
ISCAS
2007
IEEE
14 years 2 months ago
2007
IEEE
—Two probabilistic-based models, namely the Ensemble-Dependent Matrix model [1][3] and the Markov Random Field model [2], have been proposed to deal with faults in nanoscale syst...
ICIP
2009
IEEE
13 years 5 months ago
2009
IEEE
Still-image processing algorithms are tailored to and depend crucially upon the properties of the class of images to which they are applied, for instance natural images in consumer...
ENGL
2007
13 years 7 months ago
2007
—A hybrid translinear (TL) circuit constituted by two kinds of transistors, bipolar and CMOS transistors, was proposed to control its quiescent current. And a new method was intr...