Nanoelectronic components are expected to suffer from very high error rates, implying the need for hardening techniques. We propose a fine-grained approach to harden a promising...
For many years, CMOS process scaling has allowed a steady increase in the operating frequency and integration density of integrated circuits. Only recently, however, have we reach...
Robustness of high fan-in domino circuits is degraded by technology scaling due to exponential increase in leakage. In this paper, we propose a new domino circuit for high fan-in ...
Farshad Moradi, Hamid Mahmoodi-Meimand, Ali Peirav...
Abstract - This paper describes the development of a concurrent methodology for standard cell library generation. Use of a novel physical design automation method enables a high de...
Donald G. Baltus, Thomas Varga, Robert C. Armstron...
We present an efficient optimization scheme for gate sizing in the presence of process variations. Using a posynomial delay model, the delay constraints are modified to incorporat...