371 search results - page 2 / 75 » A New Method for Interoperability Test Generation |
ICCD
2006
IEEE
14 years 1 months ago
2006
IEEE
—This paper introduces a new class of sequential circuits called acyclically testable sequential circuits which is wider than the class of acyclic sequential circuits but whose t...
ISESE
2002
IEEE
14 years 10 days ago
2002
IEEE
Recent software systems contain a lot of functions to provide various services. According to this tendency, software testing becomes more difficult than before and cost of testing...
ICCD
2006
IEEE
14 years 4 months ago
2006
IEEE
—X-filling is preferred for low-capture-power scan test generation, since it reduces IR-drop-induced yield loss without the need of any circuit modification. However, the effecti...
ISSRE
2000
IEEE
13 years 11 months ago
2000
IEEE
Automated generation of test cases is a prerequisite for fast testing. Whereas the research has addressed the creation of individual test points, test trajectoiy generation has at...
FORTE
2004
13 years 8 months ago
2004
Internet software tightly integrates classic computation with communication software. Heterogeneity and complexity can be tackled with a component-based approach, where components ...