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» A Novel Method to Improve the Test Efficiency of VLSI Tests
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ACCV
2007
Springer
14 years 1 months ago
Face Mis-alignment Analysis by Multiple-Instance Subspace
In this paper, we systematically study the effect of poorly registered faces on the training and inferring stages of traditional face recognition algorithms. We then propose a nov...
Zhiguo Li, Qingshan Liu, Dimitris N. Metaxas
RECOMB
2011
Springer
12 years 10 months ago
Rich Parameterization Improves RNA Structure Prediction
Motivation. Current approaches to RNA structure prediction range from physics-based methods, which rely on thousands of experimentally-measured thermodynamic parameters, to machin...
Shay Zakov, Yoav Goldberg, Michael Elhadad, Michal...
ECCV
2004
Springer
14 years 9 months ago
Face Recognition with Local Binary Patterns
In this work, we present a novel approach to face recognition which considers both shape and texture information to represent face images. The face area is first divided into small...
Abdenour Hadid, Matti Pietikäinen, Timo Ahone...
SBCCI
2003
ACM
213views VLSI» more  SBCCI 2003»
14 years 29 days ago
Algorithms and Tools for Network on Chip Based System Design
Network on Chip (NoC) is a new paradigm for designing core based System on Chips. It supports high degree of reusability and is scalable. In this paper, an efficient Two-Step Gene...
Tang Lei, Shashi Kumar
ICCAD
1999
IEEE
153views Hardware» more  ICCAD 1999»
14 years 4 hour ago
Cycle time and slack optimization for VLSI-chips
We consider the problem of finding an optimal clock schedule, i.e. optimal arrival times for clock signals at latches of a VLSI chip. We describe a general model which includes al...
Christoph Albrecht, Bernhard Korte, Jürgen Sc...