590 search results - page 6 / 118 » A Novel Method to Improve the Test Efficiency of VLSI Tests |
ASPDAC
2004
ACM
14 years 27 days ago
2004
ACM
— We examine an abstract formulation of BIST diagnosis in digital logic systems. The BIST diagnosis problem has applications that include identification of erroneous test vector...
VLSISP
2010
13 years 5 months ago
2010
Abstract Polyphase channelizer is an important component of subband adaptive filtering systems. This paper presents an energy-efficient hardware architecture and VLSI implementatio...
DATE
2008
IEEE
14 years 1 months ago
2008
IEEE
Low-Cost test methodologies for Systems-on-Chip are increasingly popular. They dictate which features have to be included on-chip and which test procedures have to be adopted in o...
VLSID
2001
IEEE
14 years 7 months ago
2001
IEEE
A technique for signature based diagnosis using windows of different sizes is presented. It allows to obtain increased diagnostic information from a given test at a lower cost, wi...
VLSID
1993
IEEE
13 years 11 months ago
1993
IEEE
This paper discusses a Genetic Algorithm-based method of generating test vectorsfor detecting faults in combinational circuits. The GA-based approach combines the merits of two te...