590 search results - page 9 / 118 » A Novel Method to Improve the Test Efficiency of VLSI Tests |
PVLDB
2008
13 years 7 months ago
2008
Graphs are widely used to model complicated data semantics in many applications. In this paper, we aim to develop efficient techniques to retrieve graphs, containing a given query...
GECCO
2006
Springer
13 years 11 months ago
2006
Springer
Embedded systems are often used in a safety-critical context, e.g. in airborne or vehicle systems. Typically, timing constraints must be satisfied so that real-time embedded syste...
DATE
2010
IEEE
13 years 11 months ago
2010
IEEE
Model checking techniques are promising for automated generation of directed tests. However, due to the prohibitively large time and resource requirements, conventional model chec...
ICCD
2004
IEEE
14 years 4 months ago
2004
IEEE
— Reduction in test power is important to improve battery life in portable devices employing periodic self-test, to increase reliability of testing and to reduce test-cost. In sc...
DAC
2004
ACM
14 years 8 months ago
2004
ACM
We present novel and efficient methods for on-line testing in FPGAs. The testing approach uses a ROving TEster (ROTE), which has provable diagnosabilities and is also faster than ...