6 search results - page 1 / 2 » A P1500-Compatible Programmable BIST Approach for the Test o... |
DATE
2003
IEEE
14 years 25 days ago
2003
IEEE
In this paper we present a microprocessor-based approach suitable for embedded flash memory testing in a System-on-achip (SOC) environment. The main novelty of the approach is the...
CATA
2009
13 years 8 months ago
2009
ABSTRACT: We present a Built-In Self-Test (BIST) approach for programmable embedded memories in Xilinx Virtex-4 Field Programmable Gate Arrays (FPGAs). The target resources are the...
DFT
2009
IEEE
14 years 2 months ago
2009
IEEE
This paper presents the first implementation of Built-In Self-Test (BIST) of Field Programmable Gate Arrays (FPGAs) using a soft core embedded processor for reconfiguration of the...
CSREAESA
2009
13 years 8 months ago
2009
A Built-In Self-Test (BIST) approach is presented for the Internal Configuration Access Port (ICAP) and Frame Error Correcting Code (ECC) logic cores embedded in Xilinx Virtex-4 an...
ITC
2003
IEEE
14 years 24 days ago
2003
IEEE
1 This paper addresses the issue of testing and diagnosing a memory core embedded in a complex SOC. The proposed solution is based on a P1500-compliant wrapper that follows a progr...