78 search results - page 13 / 16 » A Pitfall in Determining the Optimal Feature Subset Size |
ISNN
2007
Springer
14 years 1 months ago
2007
Springer
Abstract. This paper investigates the construction of a wide class of singlehidden layer neural networks (SLNNs) with or without tunable parameters in the hidden nodes. It is a cha...
ICCAD
1997
IEEE
13 years 11 months ago
1997
IEEE
Interconnect has become the dominating factor in determining circuit performance and reliability in deep submicron designs. In this embedded tutorial, we first discuss the trends...
CVPR
2008
IEEE
14 years 1 months ago
2008
IEEE
We propose a new method to partition an unlabeled dataset, called Discriminative Context Partitioning (DCP). It is motivated by the idea of splitting the dataset based only on how...
ICPADS
2010
IEEE
13 years 5 months ago
2010
IEEE
As the core count in high-performance computing systems keeps increasing, faults are becoming common place. Checkpointing addresses such faults but captures full process images ev...
DAC
2004
ACM
13 years 11 months ago
2004
ACM
The ability to control the variations in IC fabrication process is rapidly diminishing as feature sizes continue towards the sub-100 nm regime. As a result, there is an increasing...