62 search results - page 10 / 13 » A Practical Architecture for Reliable Quantum Computers |
138
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VLSID
2008
IEEE
16 years 6 months ago
2008
IEEE
Negative Bias Temperature Instability (NBTI) has been identified as a major and critical reliability issue for PMOS devices in nano-scale designs. It manifests as a negative thres...
166
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DAC
2007
ACM
16 years 6 months ago
2007
ACM
An effective method for focusing optimization effort on the most important parts of a design is to examine those elements on the critical path. Traditionally, the critical path is...
145
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DAC
2003
ACM
16 years 6 months ago
2003
ACM
With the scaling of technology, power grid noise is becoming increasingly significant for circuit performance. A typical power grid circuit contains millions of linear elements, m...
141
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HPDC
2010
IEEE
15 years 6 months ago
2010
IEEE
Today, the BitTorrent Peer-to-Peer file-sharing network is one of the largest Internet applications--it generates massive traffic volumes, it is deployed in thousands of independe...
173
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TC
2011
15 years 17 days ago
2011
—CMOS scaling has long been a source of dramatic performance gains. However, semiconductor feature size reduction has resulted in increasing levels of operating temperatures and ...