371 search results - page 14 / 75 » A Precedence PEPA Model for Performance and Reliability Anal... |
DAC
2006
ACM
14 years 1 months ago
2006
ACM
Negative bias temperature instability (NBTI) has become the dominant reliability concern for nanoscale PMOS transistors. In this paper, a predictive model is developed for the deg...
KDD
2012
ACM
11 years 10 months ago
2012
ACM
Crowdsourcing has recently become popular among machine learning researchers and social scientists as an effective way to collect large-scale experimental data from distributed w...
DAC
2003
ACM
14 years 27 days ago
2003
ACM
We present a new technique to examine the trade-off regions of a circuit where its competing performances become “simultaneously optimal”, i.e. Pareto optimal. It is based on ...
TC
2010
13 years 2 months ago
2010
A distinct characteristic of multistate systems (MSS) is that the systems and/or their components may exhibit multiple performance levels (or states) varying from perfect operation...
DAC
2008
ACM
14 years 8 months ago
2008
ACM
1 Soft errors induced by radiation are an increasing problem in the microelectronic field. Although traditional models estimate the reliability of memories suffering Single Event U...