371 search results - page 15 / 75 » A Precedence PEPA Model for Performance and Reliability Anal... |
Publication
The widespread adoption of automated vehicle location systems (AVL) and automatic passenger counters (APC) in the transit industry has opened new venues in operations and system mo...
DATE
2010
IEEE
14 years 22 days ago
2010
IEEE
Abstract—Negative bias temperature instability (NBTI) significantly affects nanoscale integrated circuit performance and reliability. The degradation in threshold voltage (Vth) d...
DATE
2007
IEEE
14 years 2 months ago
2007
IEEE
High reliability against noise, low energy consumption and high performance are key objectives in the design of on-chip networks. Recently some researchers have considered the var...
DAC
2007
ACM
14 years 8 months ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
BMCBI
2005
13 years 7 months ago
2005
Background: Protein sequence alignments have become indispensable for virtually any evolutionary, structural or functional study involving proteins. Modern sequence search and com...