515 search results - page 21 / 103 » A Reduced Complexity Algorithm for Minimizing N-Detect Tests |
ICCAD
2006
IEEE
14 years 5 months ago
2006
IEEE
Parametric yield loss due to variability can be effectively reduced by both design-time optimization strategies and by adjusting circuit parameters to the realizations of variable...
DATE
2006
IEEE
14 years 2 months ago
2006
IEEE
This paper presents a wrapper and test access mechanism design for multi-clock domain SoCs that consists of cores with different clock frequencies during test. We also propose a t...
CDC
2008
IEEE
13 years 10 months ago
2008
IEEE
Abstract-- Detecting and isolating multiple faults is a computationally intense task which typically consists of computing a set of tests, and then computing the diagnoses based on...
DAC
1996
ACM
14 years 17 days ago
1996
ACM
We propose a low-overhead scan design methodology which employs a new test point insertion technique to establish scan paths through the functional logic. The technique re-uses th...
HOTSWUP
2009
ACM
14 years 9 days ago
2009
ACM
Recent years have seen significant advances in dynamic software updating (DSU) systems, which allow programs to be patched on the fly. However, a significant challenge remains: Ho...