As technology scales ever further, device unreliability is creating excessive complexity for hardware to maintain the illusion of perfect operation. In this paper, we consider whe...
Marc de Kruijf, Shuou Nomura, Karthikeyan Sankaral...
The design and development of complex software systems is a difficult task, and it is not easy to ensure the quality of a developed software. The paper presents an architectural ...
The parameters in these software reliability models are usually directly obtained from the field failure data. Due to the dynamic properties of the system and the insufficiency of...
Jung-Hua Lo, Chin-Yu Huang, Sy-Yen Kuo, Michael R....
Today’s nanometer technology trends have a very negative impact on the reliability of semiconductor products. Intermittent faults constitute the largest part of reliability fail...
Nektarios Kranitis, Andreas Merentitis, N. Laoutar...
—This paper describes a method of linearizing the nonlinear characteristics of many sensors using an embedded neural network. The proposed method allows for complex neural networ...