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» A Small Test Generator for Large Designs
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CEC
2005
IEEE
14 years 1 months ago
Evolution of L-systems for compact virtual landscape generation
An L-system or Lindenmayer system consists of a grammar and an interpreter. The grammar contains an axiom, usually a short string, that the grammar expands into a long, complex st...
Daniel A. Ashlock, Stephen P. Gent, Kenneth Mark B...
JCB
2008
94views more  JCB 2008»
13 years 7 months ago
Prioritize and Select SNPs for Association Studies with Multi-Stage Designs
Large-scale whole genome association studies are increasingly common, due in large part to recent advances in genotyping technology. With this change in paradigm for genetic studi...
Jing Li
ISQED
2010
IEEE
121views Hardware» more  ISQED 2010»
14 years 24 days ago
A novel two-dimensional scan-control scheme for test-cost reduction
— This paper proposes a two-dimensional scan shift control concept for multiple scan chain design. Multiple scan chain test scheme provides very low scan power by skipping many l...
Chia-Yi Lin, Hung-Ming Chen
MTV
2005
IEEE
128views Hardware» more  MTV 2005»
14 years 1 months ago
Automated Extraction of Structural Information from SystemC-based IP for Validation
The increasing complexity and size of system level design models introduces a difficult challenge for validating them. Hence, in most industries, design validation takes a large p...
David Berner, Hiren D. Patel, Deepak Mathaikutty, ...
ITC
2003
IEEE
134views Hardware» more  ITC 2003»
14 years 29 days ago
Effectiveness Improvement of ECR Tests
Energy Consumption Ratio (ECR) test, a current-based test, has shown its ability to reduce the impact of process variations and detect hard-to-detect faults. The effectiveness of ...
Wanli Jiang, Erik Peterson, Bob Robotka