420 search results - page 40 / 84 » A Small Test Generator for Large Designs |
DSN
2007
IEEE
14 years 2 months ago
2007
IEEE
— Device scaling and large integration increase the vulnerability of microprocessors to transient errors. One of the structures where errors can be most harmful is the register ...
MEMOCODE
2007
IEEE
14 years 1 months ago
2007
IEEE
Due to the rapidly growing speed and the decreasing size of gates in modern chips, the probability of faults caused by the production process grows. Already small variations lead ...
CVPR
2009
IEEE
15 years 2 months ago
2009
IEEE
We propose a novel approach to designing algorithms for
object tracking based on fusing multiple observation models.
As the space of possible observation models is too large
for...
PLDI
2012
ACM
11 years 10 months ago
2012
ACM
To report a compiler bug, one must often find a small test case that triggers the bug. The existing approach to automated test-case reduction, delta debugging, works by removing ...
ISCAS
2002
IEEE
14 years 17 days ago
2002
IEEE
There is a need among scientists and clinicians for lownoise, low-power biosignal amplifiers capable of amplifying signals in the mHz to kHz range while rejecting large dc offsets...