We discuss the compaction of independent test sequences for sequential circuits. Our first contribution is the formulation of this problem as an integer program, which we then so...
Based on a timing yield model, a statistical static timing analysis technique is proposed. This technique preserves existing methodology by selecting a “device file setting” ...
When peak performance is unnecessary, Dynamic Voltage Scaling (DVS) can be used to reduce the dynamic power consumption of embedded multiprocessors. In future technologies, however...
We present a new approach to detecting defects in random textures which requires only very few defect free samples for unsupervised training. Each product image is divided into ove...
We introduce an indexing scheme for the vertices of semi-regular meshes, based on interleaving quadtrees rooted on the edges of the base mesh. Using this indexing scheme we develo...