33 search results - page 2 / 7 » A Statistic-Based Approach to Testability Analysis |
EURODAC
1990
IEEE
13 years 11 months ago
1990
IEEE
: In this paper logical cells and algorithms are presented supporting the design of pseudo-exhaustively testable circuits. The approach is based on real hardware segmentation, inst...
BMCBI
2010
13 years 7 months ago
2010
Background: Several tools have been developed to explore and search Gene Ontology (GO) databases allowing efficient GO enrichment analysis and GO tree visualization. Nevertheless,...
ITC
1997
IEEE
13 years 10 months ago
1997
IEEE
This paper proposes an environment to address Testability Analysis and Test Pattern Generation on VHDL descriptions at the RT-level. The proposed approach, based on a suitable fau...
DATE
2002
IEEE
13 years 11 months ago
2002
IEEE
This paper develops an improved approach for hierarchical functional test generation for complex chips. In order to deal with the increasing complexity of functional test generati...
ICCD
2004
IEEE
14 years 3 months ago
2004
IEEE
Increasing system complexity and test cost demands new system-level solutions for mixed-signal systems. In this paper, we present a testability analysis and DfT insertion methodol...