340 search results - page 4 / 68 » A Statistical Performance Simulation Methodology for VLSI Ci... |
ICCAD
1996
IEEE
14 years 22 days ago
1996
IEEE
A methodology for hierarchicalstatistical circuit characterization which does not rely upon circuit-level Monte Carlo simulation is presented. The methodology uses principalcompon...
ICCAD
2000
IEEE
14 years 29 days ago
2000
IEEE
In this paper, we present simulation techniques to estimate the worst-case voltage variation using a RC model for the power distribution network. Pattern independent maximum envel...
ISVLSI
2003
IEEE
14 years 1 months ago
2003
IEEE
Three-dimensional integration technologies have been proposed in order to mitigate design challenges posed by deep-submicron interconnect. By providing multiple layers of active d...
VLSID
2008
IEEE
14 years 9 months ago
2008
IEEE
Negative Bias Temperature Instability (NBTI) has been identified as a major and critical reliability issue for PMOS devices in nano-scale designs. It manifests as a negative thres...
DFT
2005
IEEE
14 years 2 months ago
2005
IEEE
A new jitter model is developed using Matlab and Spice to analyze Data Dependent Jitter (DDJ) in serial data integrated circuits. The simulation results show that DDJ is dependent...