340 search results - page 7 / 68 » A Statistical Performance Simulation Methodology for VLSI Ci... |
GLVLSI
2006
IEEE
14 years 2 months ago
2006
IEEE
As CMOS devices and operating voltages are scaled down, noise and defective devices will impact the reliability of digital circuits. Probabilistic computing compatible with CMOS o...
HPCA
2003
IEEE
14 years 9 months ago
2003
IEEE
Due to cost, time, and flexibility constraints, simulators are often used to explore the design space when developing a new processor architecture, as well as when evaluating the ...
GLVLSI
2006
IEEE
14 years 2 months ago
2006
IEEE
Reliability has become a significant challenge for system design in new process technologies. Higher integration levels dramatically increase power densities, which leads to high...
DAC
2005
ACM
13 years 10 months ago
2005
ACM
Reliability of nanometer circuits is becoming a major concern in today’s VLSI chip design due to interferences from multiple noise sources as well as radiation-induced soft erro...
GLVLSI
2007
IEEE
13 years 10 months ago
2007
IEEE
We present a vector selection methodology for estimating the peak power dissipation in a CMOS logic circuit. The ultimate goal is to combine the speed of RT-level simulation with ...