641 search results - page 1 / 129 » A Study in Coverage-Driven Test Generation |
DAC
1999
ACM
14 years 8 months ago
1999
ACM
DATE
2005
IEEE
14 years 1 months ago
2005
IEEE
Functional verification of microprocessors is one of the most complex and expensive tasks in the current system-on-chip design process. A significant bottleneck in the validatio...
KBSE
1999
IEEE
13 years 11 months ago
1999
IEEE
CORR
2011
Springer
13 years 2 months ago
2011
Springer
This paper investigates the impact of the changes of the characteristic polynomials and initial loadings, on behaviour of aliasing errors of parallel signature analyzer (Multi-Inp...
PTS
2010
13 years 5 months ago
2010
This paper addresses the challenge of generating test sets that achieve functional coverage, in the absence of a complete specification. The inductive testing technique works by p...