209 search results - page 15 / 42 » A Systematic Approach for Designing Testable VLSI Circuits |
GLVLSI
1999
IEEE
14 years 1 days ago
1999
IEEE
Despite the seemingly endless upwards spiral of modern VLSI technology, many experts are predicting a hard wall for CMOS in about a decade. Given this, researchers continue to loo...
VTS
1999
IEEE
14 years 7 hour ago
1999
IEEE
High-level test pattern generation is today a widely investigated research topic. The present paper proposes a fully automated, simulation-based ATPG system, to address test patte...
ISLPED
2007
ACM
13 years 9 months ago
2007
ACM
We present a novel detailed placement technique that accounts for systematic through-pitch variations to reduce leakage. Leakage depends nearly exponentially on linewidth (gate le...
IJCV
1998
13 years 7 months ago
1998
In the course of designing an integrated system for locating the focus of expansion (FOE) from a sequence of images taken while a camera is translating, a variety of direct motion ...
VLSID
2002
IEEE
14 years 8 months ago
2002
IEEE
Increasing complexity of the functionalities and the resultant growth in number of gates integrated in a chip coupled with shrinking geometries and short cycle time requirements br...