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SIGSOFT
2007
ACM
14 years 9 months ago
A specification-based approach to testing software product lines
This paper presents a specification-based approach for systematic testing of products from a software product line. Our approach uses specifications given as formulas in Alloy, a ...
Engin Uzuncaova, Daniel Garcia, Sarfraz Khurshid, ...
ET
2000
145views more  ET 2000»
13 years 8 months ago
Fast Test Pattern Generation for Sequential Circuits Using Decision Diagram Representations
The paper presents a novel hierarchical approach to test pattern generation for sequential circuits based on an input model of mixed-level decision diagrams. A method that handles,...
Jaan Raik, Raimund Ubar
DATE
2005
IEEE
115views Hardware» more  DATE 2005»
14 years 2 months ago
Functional Coverage Driven Test Generation for Validation of Pipelined Processors
Functional verification of microprocessors is one of the most complex and expensive tasks in the current system-on-chip design process. A significant bottleneck in the validatio...
Prabhat Mishra, Nikil D. Dutt
ISCAS
1999
IEEE
106views Hardware» more  ISCAS 1999»
14 years 25 days ago
Test pattern generation for width compression in BIST
The main objectives of Built-In Self Test (BIST) are the design of test pattern generator circuits which achieve the highest fault coverage, require the shortest sequence of test ...
Paulo F. Flores, Horácio C. Neto, K. Chakra...
SIGSOFT
2007
ACM
14 years 9 months ago
State space exploration using feedback constraint generation and Monte-Carlo sampling
The systematic exploration of the space of all the behaviours of a software system forms the basis of numerous approaches to verification. However, existing approaches face many c...
Sriram Sankaranarayanan, Richard M. Chang, Guofei ...