819 search results - page 52 / 164 » A Technique for Combined Virtual Prototyping and Hardware De... |
ICCAD
2006
IEEE
14 years 5 months ago
2006
IEEE
Soft errors in logic are emerging as a significant reliability problem for VLSI designs. This paper presents novel circuit optimization techniques to mitigate soft error rates (SE...
ASPLOS
2006
ACM
14 years 2 months ago
2006
ACM
Virtualization is increasingly being used to address server management and administration issues like flexible resource allocation, service isolation and workload migration. In a...
SP
2002
IEEE
13 years 7 months ago
2002
IEEE
The Grid-based Virtual Laboratory AMsterdam (VLAM-G), provides a science portal for distributed analysis in applied scientific research. It offers scientists experiment control, d...
ISQED
2008
IEEE
14 years 2 months ago
2008
IEEE
We proposed a combined magnetic and circuit level technique to explore the design methodology of SpinTorque Transfer RAM (SPRAM). A dynamic magnetic model of magnetic tunneling ju...
MICRO
2008
IEEE
14 years 2 months ago
2008
IEEE
—Negative bias temperature instability (NBTI), which reduces the lifetime of PMOS transistors, is becoming a growing reliability concern for sub-micrometer CMOS technologies. Par...