70 search results - page 6 / 14 » A Test Pattern Generation Methodology for Low-Power Consumpt... |
ACL
2006
14 years 8 days ago
2006
This paper introduces a method for the semi-automatic generation of grammar test items by applying Natural Language Processing (NLP) techniques. Based on manually-designed pattern...
SAC
2008
ACM
13 years 10 months ago
2008
ACM
Software-based self-test (SBST) is emerging as a promising technology for enabling at-speed testing of high-speed embedded processors testing in an SoC system. For SBST, test rout...
ICCAD
2003
IEEE
14 years 4 months ago
2003
IEEE
Domino circuits have been used in most modern high-performance microprocessor designs because of their high speed, low transistor-count and hazard-free operation. However, with te...
CASES
2006
ACM
14 years 4 months ago
2006
ACM
Rising interest in the applications of wireless sensor networks has spurred research in the development of computing systems for lowthroughput, energy-constrained applications. Un...
CASES
2007
ACM
14 years 2 months ago
2007
ACM
The key to increasing performance without a commensurate increase in power consumption in modern processors lies in increasing both parallelism and core specialization. Core speci...