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142
Voted
DATE
2004
IEEE
15 years 7 months ago
2004
IEEE
Formal verification techniques have been playing an important role in pre-silicon validation processes. One of the most important points considered in performing formal verificati...
183
Voted
TFM
2009
Springer
15 years 10 months ago
2009
Springer
action and Modelling - a complementary partnership” 10h30 – 11h 00 Coffee break 11h-12h30 Session 1 “Model Transformation: Foundations” Algebraic models for bidirectional m...
132
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DAC
2007
ACM
16 years 4 months ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
144
Voted
ICCAD
2002
IEEE
16 years 13 days ago
2002
IEEE
In this survey, we outline basic SAT- and ATPGprocedures as well as their applications in formal hardware verification. We attempt to give the reader a trace trough literature and...
136
Voted
ICIP
2002
IEEE
16 years 5 months ago
2002
IEEE
Human observers can easily assess the quality of a distorted image without examining the original image as a reference. By contrast, designing objective No-Reference (NR) quality ...