Formal verification techniques have been playing an important role in pre-silicon validation processes. One of the most important points considered in performing formal verificati...
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
In this survey, we outline basic SAT- and ATPGprocedures as well as their applications in formal hardware verification. We attempt to give the reader a trace trough literature and...
Human observers can easily assess the quality of a distorted image without examining the original image as a reference. By contrast, designing objective No-Reference (NR) quality ...