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» A Transitive Closure Based Algorithm for Test Generation
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EURODAC
1994
IEEE
148views VHDL» more  EURODAC 1994»
13 years 11 months ago
BiTeS: a BDD based test pattern generator for strong robust path delay faults
This paper presents an algorithm for generation of test patterns for strong robust path delay faults, i.e. tests that propagate the fault along a single path and additionally are ...
Rolf Drechsler
ACSD
2010
IEEE
197views Hardware» more  ACSD 2010»
13 years 5 months ago
Order-Independence of Vector-Based Transition Systems
Abstract--Semantics of many specification languages, particularly those used in the domain of hardware, is described in terms of vector-based transition systems. In such a transiti...
Matthias Raffelsieper, Mohammad Reza Mousavi, Hans...
ENTCS
2010
99views more  ENTCS 2010»
13 years 7 months ago
State Based Robustness Testing for Components
Component based development allows to build software upon existing components and promises to improve software reuse and reduce costs. To gain reliability of a component based sys...
Bin Lei, Zhiming Liu, Charles Morisset, Xuandong L...
ICCD
2004
IEEE
109views Hardware» more  ICCD 2004»
14 years 4 months ago
Low Power Test Data Compression Based on LFSR Reseeding
Many test data compression schemes are based on LFSR reseeding. A drawback of these schemes is that the unspecified bits are filled with random values resulting in a large number ...
Jinkyu Lee, Nur A. Touba
AADEBUG
1997
Springer
13 years 11 months ago
Modeling Intelligent System Execution as State Transition Diagrams to Support Debugging
Currently, few tools are available for assisting developers with debugging intelligent systems. Because these systems rely heavily on context dependent knowledge and sometimes sto...
Adele E. Howe, Gabriel Somlo