729 search results - page 21 / 146 » A Transitive Closure Based Algorithm for Test Generation |
CONCUR
1999
Springer
13 years 12 months ago
1999
Springer
This paper discusses the use of formal methods in testing of concurrent systems. It is argued that formal methods and testing can be mutually profitable and useful. A framework fo...
NPAR
2006
ACM
14 years 1 months ago
2006
ACM
We present techniques to create convincing high-quality watercolor illustrations of plants. Mainly focusing on the real-time rendering, we introduce methods to abstract the visual...
GECCO
2007
Springer
14 years 1 months ago
2007
Springer
Fault-based testing is often advocated to overcome limitations of other testing approaches; however it is also recognized as being expensive. On the other hand, evolutionary algor...
ICCD
2003
IEEE
14 years 27 days ago
2003
IEEE
Excessive switching activity during shift cycles in scan-based cores imposes considerable test power challenges. To ensure rapid and reliable test of SOCs, we propose a scan chain...
DATE
1997
IEEE
13 years 12 months ago
1997
IEEE
A structural, fault-model based methodology for the generation of compact high-quality test sets for analog macros is presented. Results are shown for an IVconverter macro design....