729 search results - page 28 / 146 » A Transitive Closure Based Algorithm for Test Generation |
EURODAC
1995
IEEE
13 years 11 months ago
1995
IEEE
: We present a new, dynamic algorithm for test sequence compaction and test cycle reduction for combinationaland sequential circuits. Several dynamic algorithms for compaction in c...
TACAS
2005
Springer
14 years 1 months ago
2005
Springer
Object-oriented unit tests consist of sequences of method invocations. Behavior of an invocation depends on the method’s arguments and the state of the receiver at the beginning ...
ITC
2003
IEEE
14 years 27 days ago
2003
IEEE
: The paper presents a novel technique for generating effective vectors for delay defects. The test set achieves high path delay fault coverage to capture smalldistributed delay de...
VLSID
2009
IEEE
14 years 8 months ago
2009
IEEE
We present the automatic test pattern generator TIGUAN based on a thread-parallel SAT solver. Due to a tight integration of the SAT engine into the ATPG algorithm and a carefully ...
ICRA
2003
IEEE
14 years 28 days ago
2003
IEEE
- This paper presents a third-order spline interpolation based trajectory planning method which is aiming to achieve smooth biped swing leg trajectory by reducing the instant veloc...